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    图片 型号 库存 价格 数量 规格书 系列 封装/外壳 包装 产品状态 逻辑类型 电源电压 位数 工作温度 等级 认证 安装类型 供应商设备封装
    SN74ABT8652DLR

    SN74ABT8652DLR

    IC SCAN TEST DEVICE 28-SSOP

    Texas Instruments

    0
    SN74ABT8652DLR

    规格书

    74ABT 28-BSSOP (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-BSSOP
    SN74ABT8543DWRG4

    SN74ABT8543DWRG4

    IC SCAN TEST DEVICE 28SOIC

    Texas Instruments

    0
    SN74ABT8543DWRG4

    规格书

    74ABT 28-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Registered Bus Transceiver 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
    SN74ABT8646DWRG4

    SN74ABT8646DWRG4

    IC SCAN TEST DEVICE 28SOIC

    Texas Instruments

    0
    SN74ABT8646DWRG4

    规格书

    74ABT 28-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
    SN74ABT8652DWRG4

    SN74ABT8652DWRG4

    IC SCAN TEST DEVICE 28SOIC

    Texas Instruments

    0
    SN74ABT8652DWRG4

    规格书

    74ABT 28-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
    SN74SSTUB32864NMJR

    SN74SSTUB32864NMJR

    IC CONFIG REG BUFF 25BIT 96-BGA

    Texas Instruments

    0
    SN74SSTUB32864NMJR

    规格书

    74SSTUB 96-LFBGA Tape & Reel (TR) Active Configurable Registered Buffer 1.7V ~ 1.9V 25, 14 -40°C ~ 85°C - - Surface Mount 96-NFBGA (13.5x5.5)
    SN74ABT8646DLR

    SN74ABT8646DLR

    IC SCAN TEST DEVICE 28-SSOP

    Texas Instruments

    0
    SN74ABT8646DLR

    规格书

    74ABT 28-BSSOP (0.295", 7.50mm Width) Tape & Reel (TR) Active Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-BSSOP
    LM9779CCVS/NOPB

    LM9779CCVS/NOPB

    IC DATA CONVERSION

    Texas Instruments

    0

    -

    * - Tray Active - - - - - - - -
    SN74BCT8374ANTG4

    SN74BCT8374ANTG4

    IC SCAN TEST DEVICE W/FF 24-DIP

    Texas Instruments

    0
    SN74BCT8374ANTG4

    规格书

    74BCT 24-DIP (0.300", 7.62mm) Tube Obsolete Scan Test Device with D-Type Edge-Triggered Flip-Flops 4.5V ~ 5.5V 8 0°C ~ 70°C - - Through Hole 24-PDIP
    SN74SSQEB32882ZALR

    SN74SSQEB32882ZALR

    IC REGSTR BUFFER 28-56BIT 176BGA

    Texas Instruments

    0
    SN74SSQEB32882ZALR

    规格书

    74SSQEB 176-TFBGA Tape & Reel (TR) Active 1:2 Registered Buffer with Parity 1.25V, 1.35V, 1.5V 28, 56 - - - Surface Mount 176-NFBGA (13.5x8)
    SN74LVT8980ADWRG4

    SN74LVT8980ADWRG4

    IC TEST-BUS CONTROLLER 24-SOIC

    Texas Instruments

    0
    SN74LVT8980ADWRG4

    规格书

    74LVT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Discontinued at Digi-Key Embedded Test-Bus Controllers 2.7V ~ 3.6V 8 -40°C ~ 85°C - - Surface Mount 24-SOIC
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